Items

• AF ISH 007 XRF acquisition
  Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy
• AF ZMT 006 XRF acquisition
  Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy
• AF ZMT 005 XRF acquisition
  Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy
• AF SHI 004 XRF acquisition
  Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy
• AF ZMT 003 XRF acquisition
  Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy
• AF UEN 001 XRF acquisition
  Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy
• AF TTK 010 SEM EDX processing and modeling
  Chemical examination of AF TTK 010 cross section.
• AF TTK 010 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF TTK 009 SEM EDX processing and modeling
  Chemical examination of AF TTK 009 cross section.
• AF TTK 009 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF TTK 008 SEM EDX processing and modeling
  Elemental examination of AF TTK 008 cross section.
• AF TTK 008 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF TTK 007 SEM EDX processing and modeling
  Elemental examination of AF TTK 007 cross section.
• AF TTK 007 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF TTK 006 SEM EDX processing and modeling
  Elemental examination of AF TTK 006 cross section.
• AF TTK 006 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF TTK 005 SEM EDX processing and modeling
  Elemental examination of AF TTK 005 cross section.
• AF TTK 005 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF TTK 004 SEM EDX processing and modeling
  Elemental examination of AF TTK 004 cross section.
• AF TTK 004 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF TTK 003 SEM EDX processing and modeling
  Elemental examination of AF TTK 003 cross section.
• AF TTK 003 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF TTK 002 SEM EDX processing and modeling
  Elemental examination of AF TTK 002 cross section.
• AF TTK 002 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF TTK 001 SEM EDX processing and modeling
  Elemental examination of AF TTK 001 cross section.
• AF TTK 001 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF ISH 007 SEM EDX processing and modelling
  Elemental examination of AF ISH 007 cross section.
• AF ISH 007 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF ZMT 006 SEM EDX processing and modelling
  Elemental examination of AF ZMT 006 cross section.
• AF ZMT 006 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF ZMT 005 SEM EDX processing and modelling
  Elemental examination of AF ZMT 005 cross section.
• AF ZMT 005 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF ZMT 004 SEM EDX processing and modeling
  Elemental examination of AF ZMT 004 cross section.
• AF ZMT 004 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF ZMT 003 SEM EDX processing and modeling
  Elemental examination of AF ZMT 003 cross section.
• AF ZMT 003 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF UEN 002 SEM EDX processing and modeling
  Elemental examination of AF UEN 002 cross section.
• AF UEN 002 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF TTK 010 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification.
• AF TTK 009 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification.
• AF TTK 008 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x.
• AF TTK 007 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification.
• AF TTK 006 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification.
• AF TTK 005 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification.
• AF TTK 004 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF TTK 004 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x, 100x and 200x magnification.
• AF TTK 003 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images 1 to 6 at 50 x. Images from 7 to 16 at 200x.
• AF TTK 002 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification. Images from 1 to 5 at 50 x.
• AF TTK 001 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification. Images from 1 to 4 at 50 x.
• AF ISH 007 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x and 100x magnification. Images from right to left top and bottom surface 1 to 5 at 50 x. Image 6 at 100x.
• AF ZMT 006 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images from right to left top and bottom surface 1 to 7 at 50 x. Images from 8 to 20 at 200x.
• AF ZMT 005 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images from right to left top and bottom surface 1 to 4 at 50 x. Images from 5 to 13 at 200x.
• AF ZMT 004 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images from right to left top and bottom surface 1 to 21 at 50 x. Images from 22 to 31 at 200x.
• AF ZMT 003 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images from 1 to 8 at 50x. Images from 9 to 36 at 200x
• AF UEN 002 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images along the surface from left to right: 1 to 5 at 50x Images from 6 to 12 at 200x
• ICP-OES data table - Tatetsuki, Ueno, Zanmochi and Ishida samples
  Data table for ceramic samples from Tatetski and Shimane (Ueno, Zanmochi and Ishida) analysed by Inductive Coupled Plasma Optical Emission Spectroscopy.
• AF TTK 010 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF TTK 009 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF TTK 008 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF TTK 007 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF TTK 006 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF TTK 005 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF TTK 003 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF TTK 002 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF TTK 001 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF ISH 007 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopy with Energy Dispersive X-ray.
• AF ZMT 006 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF ZMT 005 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF ZMT 004 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF ZMT 003 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF UEN 002 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopy with Energy Dispersive X-ray.
• AF UEN 001 OM for SEM acquisition
  Optical microphotogrametry specifying areas for areas analysed by Scanning Electron Microscopy with Energy Dispersive X-ray.
• AF UEN 001 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images along the surface from left to right from 1 to 6 at 50x; 7 to 16 at 200x; Images also under 17 to 19 at 50x
• AF UEN 001 SEM EDX processing and modeling
  Elemental examination of AF UEN 001 cross section.
• AF UEN 001 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• SEM EDX - TT and SH Bodies 200x Varience
  SEM EDX varience based on the bodies values of samples from Tatetsuki and Shimne at 200x magnification.
• SEM EDX - TT and SH Bodies 200x Scores
  SEM EDX scores based on the bodies values of samples from Tatetsuki and Shimne at 200x magnification.
• SEM EDX - TT and SH Bodies 200x Modelling power
  SEM EDX modelling power based on the bodies values of samples from Tatetsuki and Shimne at 200x magnification.
• SEM EDX - TT and SH Bodies 200x Loadings
  SEM EDX values from the bodies of samples from Tatetsuki and Shimne at 200x magnification.
• AF TTK 010 PLM Data interpretation
  Micromorphology of thin section from AF TTK 010
• AF TTK 010 PLM processing and modeling
  Petrographic examination.
• AF TTK 010 PLM acquisition
  Photomicrographs acquired at different magnifications.
• AF TTK 009 PLM Data interpretation
  Micromorphology of thin section from AF TTK 009.
• AF TTK 009 PLM processing and modeling
  Petrographic examination.
• AF TTK 009 PLM acquisition
  Photomicrographs acquired at different magnifications.
• TT8 PLM Data interpretation
  Micromorphology of thin section from TT8
• TT8 PLM processing and modelling
  Petrographic examination
• TT8 PLM acquisition
  Photomicrographs acquired at different magnifications
• AF TTK 007 PLM Data interpretation
  Micromorphology of thin section from AF TTK 007
• AF TTK 007 PLM processing and modeling
  Petrographic examination
• AF TTK 007 PLM acquisition
  Photomicrographs acquired at different magnifications
• AF TTK 006 PLM Data interpretation
  Micromorphology of thin section from ceramic shard.
• AF TTK 006 PLM processing and modeling
  Petrographic examination
• AF TTK 006 PLM acquisition
  Photomicrographs acquired at different magnifications
• AF TTK 005 PLM Data interpretation
  Micromorphology of thin section from AF TTK 005.
• AF TTK 005 PLM processing and modeling
  Petrographic examination.
• AF TTK 005 PLM acquisition
  Photomicrographs acquired at different magnifications.
• AF TTK 004 PLM Data interpretation
  Micromorphology of thin section from AF TTK 004.
• AF TTK 004 PLM processing and modeling
  Petrographic examination.
• AF TTK 004 PLM acquisition
  Photomicrographs acquired at different magnifications.