AF UEN 001 PLM acquisition

Title (Dublin Core): AF UEN 001 PLM acquisition
Description (Dublin Core): en Photomicrographs acquired at different magnifications.; jp さまざまな倍率で取得した顕微鏡写真。
INVESTIGATION DATE - 分析の日付 (Archaeometric Investigation Record Vocabulary): November 3, 2019
ACQUISITION / CREATION TYPE - 分析方法 (Archaeometric Investigation Record Vocabulary): en Polarized light microscopy; jp 偏光顕微鏡; polarized light microscopy
ACQUISITION / CREATION DETAILS - 分析詳細 (Archaeometric Investigation Record Vocabulary): en Polarized light microscopy of thin sections. Each sample (fragment) was put in impregnating resin before the cut.
Mainly CEMEDINE (epoxy resin) was used for mounting the ground plane on glass slide.
Optical Microscope: Nikon Eclipse Ci POL, lambda plate: 530 nm
Magnification:
2x = 5 mm
4x = 2.5 mm
10x = 1 mm
40x = 0.5 mm; jp 薄切片の偏光顕微鏡。各サンプル（断片）は、切断前に含浸樹脂に入れられました。
スライドガラスへのグランドプレーンの取り付けには、主にセメダイン（エポキシ樹脂）を使用しました。
光学顕微鏡: Nikon Eclipse Ci POL、ラムダプレート: 530 nm
倍率：
2x = 5mm
4x = 2.5mm
10x = 1mm
40x = 0.5mm

Media: SH1_THIN_SECTION_4x_PPL; SH1_THIN_SECTION_4x_XLP; SH1_THIN_SECTION_2x_PPL; SH1_THIN_SECTION_2x_XPL

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Items with "ARCHAEOMETRIC INVESTIGATION (some archaeometric data record) - 理化学的分析あり（リンクを含める）: AF UEN 001 PLM acquisition"
Title	Class
AF UEN 001	Archaeological finding record

Items with "INPUT - 元となるデータなど: AF UEN 001 PLM acquisition"
Title	Class
AF UEN 001 PLM processing and modeling	Data_processing_or_modeling_CR