AF TTK 004 SEM images acquisition
Item
- Title (Dublin Core)
- AF TTK 004 SEM images acquisition
- Description (Dublin Core)
- en Backscattered Images acquired by Scanning Electron Microscopy at 50x, 100x and 200x magnification.
- jp 50x、100x、および 200x の倍率で走査型電子顕微鏡によって取得された後方散乱画像。
- INVESTIGATION DATE - 分析の日付 (Archaeometric Investigation Record Vocabulary)
- November 22, 2019
- INPUT - 元となるデータなど (Archaeometric Investigation Record Vocabulary)
-
AF TTK 004 OM for SEM acquisition
- ACQUISITION / CREATION TYPE - 分析方法 (Archaeometric Investigation Record Vocabulary)
- en Scanning Electron Microscopy (SEM).
- jp 走査型電子顕微鏡 (SEM).
- scanning electron microscopy
- ACQUISITION / CREATION DETAILS - 分析詳細 (Archaeometric Investigation Record Vocabulary)
-
en
At 50x magnification: Images 1, 4, 5, 7, 8, 9, 10, 12, 14, 15, 16, 17, 18, 19, 20, 21,
At 100x magnification: Images 2, 3, 6, 11, 13
200x: Images 1B to 11B -
jp
倍率 50 倍: 画像 1、4、5、7、8、9、10、12、14、15、16、17、18、19、20、21、
倍率 100 倍: 画像 2、3、6、11、13
200倍：画像1B～11B
- Item sets
- BeArchaeo virtual exhibition items
- Media
TTK04_SEM_$
TT4_SEM_Image1_50x
TT4_SEM_Image4_50x
TT4_SEM_Image5_50x
TT4_SEM_Image7_50x
TT4_SEM_Image8_50x
TT4_SEM_Image9_50x
TT4_SEM_Image10_50x
TT4_SEM_Image12_50x
TT4_SEM_Image14_50x
TT4_SEM_Image15_50x
TT4_SEM_Image16_50x
TT4_SEM_Image17_50x
TT4_SEM_Image18_50x
TT4_SEM_Image19_50x
TT4_SEM_Image20_50x
TT4_SEM_Image21_50x
TT4_SEM_Image2_100x
TT4_SEM_Image3_100x
TT4_SEM_Image6_100x
TT4_SEM_Image11_100x
TT4_SEM_Image13_100x
TT4_SEM_Image1B_200x
TT4_SEM_Image2B_200x
TT4_SEM_Image3B_200x
TT4_SEM_Image4B_200x
TT4_SEM_Image5B_200x
TT4_SEM_Image6B_200x
TT4_SEM_Image7B_200x
TT4_SEM_Image8B_200x
TT4_SEM_Image9B_200x
TT4_SEM_Image10B_200x
TT4_SEM_Image11B_200x
Linked resources
| Title | Class |
|---|---|
 AF TTK 004 |
Archaeological finding record |