AF TTK 003 SEM images acquisition
Item
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Title (Dublin Core)
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AF TTK 003 SEM images acquisition
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Description (Dublin Core)
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en
Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images 1 to 6 at 50 x. Images from 7 to 16 at 200x.
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jp
走査型電子顕微鏡で 50 倍および 200 倍の倍率で取得した後方散乱画像。画像 1 ～ 6 は 50 倍。 200x で 7 から 16 までの画像。
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INVESTIGATION DATE - 分析の日付 (Archaeometric Investigation Record Vocabulary)
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December 15, 2019
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ACQUISITION / CREATION TYPE - 分析方法 (Archaeometric Investigation Record Vocabulary)
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en
Scanning Electron Microscopy (SEM).
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jp
走査型電子顕微鏡 (SEM)。
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scanning electron microscopy
Linked resources
Items with "ARCHAEOMETRIC INVESTIGATION (some archaeometric data record) - 理化学的分析あり（リンクを含める）: AF TTK 003 SEM images acquisition"
| Title |
Class |
 AF TTK 003 |
Archaeological finding record
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AF TTK 003 OM for SEM acquisition
TTK03_SEM_$
TT3_SEM_Image1_50x
TT3_SEM_Image2_50x
TT3_SEM_Image3_50x
TT3_SEM_Image4_50x
TT3_SEM_Image5_50x
TT3_SEM_Image6_50x
TT3_SEM_Image7_200x
TT3_SEM_Image8_200x
TT3_SEM_Image9_200x
TT3_SEM_Image10_200x
TT3_SEM_Image11_200x
TT3_SEM_Image12_200x
TT3_SEM_Image13_200x
TT3_SEM_Image14_200x
TT3_SEM_Image15_200x
TT3_SEM_Image16_200x