AF TTK 002 SEM images acquisition

Title (Dublin Core): AF TTK 002 SEM images acquisition
Description (Dublin Core): en Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification. Images from 1 to 5 at 50 x.; jp 走査型電子顕微鏡で 50 倍の倍率で取得した後方散乱画像。 50 x で 1 から 5 までの画像。
INVESTIGATION DATE - 分析の日付 (Archaeometric Investigation Record Vocabulary): November 8, 2019
INPUT - 元となるデータなど (Archaeometric Investigation Record Vocabulary): AF TTK 002 OM for SEM acquisition
ACQUISITION / CREATION TYPE - 分析方法 (Archaeometric Investigation Record Vocabulary): en Scanning electron microscopy (SEM); jp 走査型電子顕微鏡(SEM); scanning electron microscopy

Media: TT2_SEM_$; TT2_SEM_Image2_50x; TT2_SEM_Image3_50x; TT2_SEM_Image4_50x; TT2_SEM_Image5_50x

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Items with "ARCHAEOMETRIC INVESTIGATION (some archaeometric data record) - 理化学的分析あり（リンクを含める）: AF TTK 002 SEM images acquisition"
Title	Class
AF TTK 002	Archaeological finding record