AF UEN 002 SEM images acquisition
Item
-
Title (Dublin Core)
-
AF UEN 002 SEM images acquisition
-
Description (Dublin Core)
-
en
Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification.
Images along the surface from left to right: 1 to 5 at 50x
Images from 6 to 12 at 200x
-
jp
走査型電子顕微鏡で 50 倍および 200 倍の倍率で取得した後方散乱画像。
左から右に表面に沿った画像: 50x で 1 ～ 5
200x で 6 から 12 までの画像
-
INVESTIGATION DATE - 分析の日付 (Archaeometric Investigation Record Vocabulary)
-
December 19, 2019
-
ACQUISITION / CREATION TYPE - 分析方法 (Archaeometric Investigation Record Vocabulary)
-
en
Scanning electron microscopy (SEM)
-
jp
走査型電子顕微鏡 (SEM)
-
scanning electron microscopy
Linked resources
Items with "ARCHAEOMETRIC INVESTIGATION (some archaeometric data record) - 理化学的分析あり（リンクを含める）: AF UEN 002 SEM images acquisition"
| Title |
Class |
 AF UEN 002 |
Archaeological finding record
|
AF UEN 002 OM for SEM acquisition
