AF TTK 001 OM for SEM acquisition

Title (Dublin Core): AF TTK 001 OM for SEM acquisition
Description (Dublin Core): en Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.; jp SEM 画像の領域を指定する光学顕微鏡写真測量法と、エネルギー分散型 X 線を使用した走査型電子顕微鏡法によって分析された領域。
INVESTIGATION DATE - 分析の日付 (Archaeometric Investigation Record Vocabulary): November 8, 2019
ACQUISITION / CREATION TYPE - 分析方法 (Archaeometric Investigation Record Vocabulary): en Optical Microscopy for Scanning Elecrtochemical Microscopy.; jp 走査電気化学顕微鏡のための光学顕微鏡。; optical microscopy

Media: TT1_OM_for_SEM_Overview; TT1_OM_for_SEM_Image_1; TT1_OM_for_SEM_Image_2; TT1_OM_for_SEM_Image_3

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Items with "ARCHAEOMETRIC INVESTIGATION (some archaeometric data record) - 理化学的分析あり（リンクを含める）: AF TTK 001 OM for SEM acquisition"
Title	Class
AF TTK 001	Archaeological finding record

Items with "INPUT - 元となるデータなど: AF TTK 001 OM for SEM acquisition"
Title	Class
AF TTK 001 SEM EDX acquisition	Data_acquisition_or_creation_CR
AF TTK 001 SEM images acquisition	Data_acquisition_or_creation_CR