AF UEN 002 OM for SEM acquisition

Title (Dublin Core): AF UEN 002 OM for SEM acquisition
Description (Dublin Core): en Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopy with Energy Dispersive X-ray.; jp SEM 画像の領域を指定する光学顕微鏡写真測量法と、エネルギー分散型 X 線を使用した走査型電子顕微鏡法によって分析された領域。
INVESTIGATION DATE - 分析の日付 (Archaeometric Investigation Record Vocabulary): December 19, 2019
ACQUISITION / CREATION TYPE - 分析方法 (Archaeometric Investigation Record Vocabulary): en Optical Microscopy for Scanning Elecrtochemical Microscopy.; jp 走査電気化学顕微鏡のための光学顕微鏡。; optical microscopy

Media: SH2_OM_for_SEM_Overview; SH2_OM_for_SEM_Area_1; SH2_OM_for_SEM_Areas_2_3; SH2_OM_for_SEM_Area_4; SH2_OM_for_SEM_Areas_5_6; SH2_OM_for_SEM_Areas_7_9; SH2_OM_for_SEM_Areas_10_to_19; SH2_OM_Surface

Filter by resource type and property:

Items with "ARCHAEOMETRIC INVESTIGATION (some archaeometric data record) - 理化学的分析あり（リンクを含める）: AF UEN 002 OM for SEM acquisition"
Title	Class
AF UEN 002	Archaeological finding record

Items with "INPUT - 元となるデータなど: AF UEN 002 OM for SEM acquisition"
Title	Class
AF UEN 002 SEM EDX acquisition	Data_acquisition_or_creation_CR
AF UEN 002 SEM images acquisition	Data_acquisition_or_creation_CR