AF TTK 001 OM acquisition

Title (Dublin Core): AF TTK 001 OM acquisition
Description (Dublin Core): en Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF TTK 001; jp セラミックサンプル AF TTK 001 の表面の光学顕微鏡 (実体顕微鏡) および研磨された断面の反射光学顕微鏡
INVESTIGATION DATE - 分析の日付 (Archaeometric Investigation Record Vocabulary): May 21, 2021
ACQUISITION / CREATION TYPE - 分析方法 (Archaeometric Investigation Record Vocabulary): en Optical microscopy; jp 光学顕微鏡; optical microscopy
ACQUISITION / CREATION DETAILS - 分析詳細 (Archaeometric Investigation Record Vocabulary): en Cross section sample treatment:
Fragment mounted in cross section with epoxy resin, polished with diamond pasted down to 1 micron
Microscope:
Leica 12.5 stereomicroscope (6-63X), visible reflected light
polarizer: no; jp 断面サンプル処理:
断片を断面にエポキシ樹脂で取り付け、ダイヤモンドを 1 ミクロンまで貼り付けて研磨
顕微鏡：
Leica 12.5 実体顕微鏡 (6-63X)、可視反射光
偏光子: いいえ

Media: TT1_Surface_8x; TT1_Surface_6.3x; TT1_Surface_10x; TT1_Cross_Section_6.3x; TT1_Cross_Section_8x; TT1_Cross_Section_16x; TT1_Cross_Section_20x; Acquisition details_OM

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Items with "ARCHAEOMETRIC INVESTIGATION (some archaeometric data record) - 理化学的分析あり（リンクを含める）: AF TTK 001 OM acquisition"
Title	Class
AF TTK 001	Archaeological finding record

Items with "INPUT - 元となるデータなど: AF TTK 001 OM acquisition"
Title	Class
AF TTK 001 OM processing and modeling	Data_processing_or_modeling_CR