AF UEN 002 PLM acquisition

Title (Dublin Core): AF UEN 002 PLM acquisition
Description (Dublin Core): en Photomicrographs acquired at different magnifications; jp さまざまな倍率で取得した顕微鏡写真。
INVESTIGATION DATE - 分析の日付 (Archaeometric Investigation Record Vocabulary): November 3, 2019
ACQUISITION / CREATION TYPE - 分析方法 (Archaeometric Investigation Record Vocabulary): en Polarized light microscopy; jp 偏光顕微鏡; polarized light microscopy
ACQUISITION / CREATION DETAILS - 分析詳細 (Archaeometric Investigation Record Vocabulary): en Polarized and cross polarized light microscopy of thin sections.
Each sample (fragment) was put in impregnating resin before the cut.
Mainly petropoxy resin was used for mounting the ground plane on glass slide.
OPTICAL MICROSCOPE
Nikon Eclipse Ci POL, lambda plate: 530 nm
Magnification:
2x = 5 mm
4x = 2.5 mm
10x = 1 mm
40x = 0.5 mm; jp 薄切片の偏光および交差偏光顕微鏡。
各サンプル（断片）は、切断前に含浸樹脂に入れられました。
主にペトロポキシ樹脂を使用して、スライドガラスにグランドプレーンを取り付けました。
光学顕微鏡
Nikon Eclipse Ci POL、ラムダプレート: 530 nm
倍率：
2x = 5mm
4x = 2.5mm
10x = 1mm
40x = 0.5mm

Media: SH2_THIN_SECTION_4x_PPL; SH2_THIN_SECTION_4x_XPL; SH2_THIN_SECTION_2x_PPL; SH2_THIN_SECTION_2x_XPL

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Items with "ARCHAEOMETRIC INVESTIGATION (some archaeometric data record) - 理化学的分析あり（リンクを含める）: AF UEN 002 PLM acquisition"
Title	Class
AF UEN 002	Archaeological finding record

Items with "INPUT - 元となるデータなど: AF UEN 002 PLM acquisition"
Title	Class
AF UEN 002 PLM processing and modeling	Data_processing_or_modeling_CR