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AF UEN 002 PLM processing and modeling

Petrographic examination.

AF UEN 002 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF UEN 002 SEM EDX processing and modeling

Elemental examination of AF UEN 002 cross section.

AF UEN 002 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification.
Images along the surface from left to right: 1 to 5 at 50x
Images from 6 to 12 at 200x

AF UEN 002 XRPD acquisition

X-ray Powder Diffraction analysis on sample AF UEN 002.

AF UEN 002 XRPD processing and modeling

Mineralogical analysis.

AF ZMT 003

Yayoi pottery - Tokusyu-Tsubo (large ceremonial vessel/jar) from Zanmochi 3 (Shimane) archaeological site.

AF ZMT 003 ICP-OES acquisition

Procedures for measurements and raw data.

AF ZMT 003 ICP-OES Data interpretation_1

Classification of clay body according to Ca and Mg concentration.

AF ZMT 003 ICP-OES processing and modeling

Quantitative elemental composition for major, minor and trace elements.

AF ZMT 003 OM acquisition

Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF ZMT 003.

AF ZMT 003 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF ZMT 003 OM process and modeling

Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).

AF ZMT 003 PLM acquisition

Photomicrographs acquired at different magnifications

AF ZMT 003 PLM Data interpretation

Micromorphology of thin section from AF ZMT 003.

AF ZMT 003 PLM processing and modeling

Petrographic examination.

AF ZMT 003 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF ZMT 003 SEM EDX processing and modeling

Elemental examination of AF ZMT 003 cross section.

AF ZMT 003 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images from 1 to 8 at 50x. Images from 9 to 36 at 200x

AF ZMT 003 XRF acquisition

Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy

AF ZMT 003 XRF processing and modeling

Elemental analysis of AF ZMT 003.

AF ZMT 003 XRPD acquisition

X-ray Powder Diffraction analysis on sample AF ZMT 003.

AF ZMT 003 XRPD processing and modeling

Mineralogical analysis.

AF ZMT 004

Yayoi pottery - Kidai (small vessel stand) from Zanmochi 4 (Shimane) archaeological site.

AF ZMT 004 ICP-OES acquisition

Procedures for measurements and raw data.

AF ZMT 004 ICP-OES Data interpretation_1

Classification of clay body according to Ca and Mg concentration.

AF ZMT 004 ICP-OES processing and modelling

Quantitative elemental composition for major, minor and trace elements.

AF ZMT 004 OM acquisition

Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF ZMT 004.

AF ZMT 004 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF ZMT 004 OM processing and modeling

Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).

AF ZMT 004 PLM acquisition

Photomicrographs acquired at different magnifications

AF ZMT 004 PLM Data interpretation

Micromorphology of thin section from AF ZMT 004.

AF ZMT 004 PLM processing and modeling

Petrographic examination

AF ZMT 004 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF ZMT 004 SEM EDX processing and modeling

Elemental examination of AF ZMT 004 cross section.

AF ZMT 004 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images from right to left top and bottom surface 1 to 21 at 50 x. Images from 22 to 31 at 200x.

AF ZMT 004 XRF processing and modeling

Elemental analysis of AF ZMT 004.

AF ZMT 004 XRPD acquisition

X-ray Powder Diffraction analysis on sample AF ZMT 004.

AF ZMT 004 XRPD processing and modeling

Mineralogical analysis

AF ZMT 005

Yayoi pottery - Kidai (vessel stand) from Zanmochi 5 (Shimane) archaeological site.

AF ZMT 005 ICP-OES acquisition

Procedures for measurements and raw data.

AF ZMT 005 ICP-OES Data interpretation_1

Classification of clay according to Ca and Mg concentration

AF ZMT 005 ICP-OES processing and modelling

Quantitative elemental composition for major, minor and trace elements.

AF ZMT 005 OM acquisition

Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF ZMT 005.

AF ZMT 005 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF ZMT 005 OM processing and modelling

Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).

AF ZMT 005 PLM acquisition

Photomicrographs acquired at different magnifications.

AF ZMT 005 PLM Data interpretation

Micromorphology of thin section from AF ZMT 005.

AF ZMT 005 PLM processing and modelling

Petrographic examination.

AF ZMT 005 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF ZMT 005 SEM EDX processing and modelling

Elemental examination of AF ZMT 005 cross section.

AF ZMT 005 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images from right to left top and bottom surface 1 to 4 at 50 x. Images from 5 to 13 at 200x.

AF ZMT 005 XRF acquisition

Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy

AF ZMT 005 XRF processing and modelling

Elemental analysis of AF ZMT 005.

AF ZMT 005 XRPD acquisition

X-ray Powder Diffraction analysis on sample AF ZMT 005.

AF ZMT 005 XRPD processing and modelling

Mineralogical analysis.

AF ZMT 006

Yayoi pottery - Kidai (vessel stand) from Zanmochi 6 (Shimane) archaeological site.

AF ZMT 006 ICP-OES Acquisition

Procedures for measurements and raw data.

AF ZMT 006 ICP-OES Data interpretation_1

Classification of clay body according to Ca and Mg concentration.

AF ZMT 006 ICP-OES processing and modelling

Quantitative elemental composition for major, minor and trace elements.

AF ZMT 006 OM acquisition

Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF ZMT 006.

AF ZMT 006 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF ZMT 006 OM processing and modelling

Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).

AF ZMT 006 PLM acquisition

Photomicrographs acquired at different magnifications.

AF ZMT 006 PLM Data interpretation

Micromorphology of thin section from AF ZMT 006

AF ZMT 006 PLM processing and modelling

Petrographic examination.

AF ZMT 006 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF ZMT 006 SEM EDX processing and modelling

Elemental examination of AF ZMT 006 cross section.

AF ZMT 006 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images from right to left top and bottom surface 1 to 7 at 50 x. Images from 8 to 20 at 200x.

AF ZMT 006 XRF acquisition

Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy

AF ZMT 006 XRF processing and modelling

Elemental analysis of AF ZMT 006.

AF ZMT 006 XRPD acquisition

X-ray Powder Diffraction analysis on sample AF ZMT 006.

AF ZMT 006 XRPD processing and modelling

Mineralogical analysis

AF ZMT 019

Earthenware pottery from the Zanmochi site in Shimane Prefecture.

島根県山持遺跡から出土した土器

AFC TBO STC 002

Sue fragments AF 064 and 065 can be combined to form a complex object.

AFC TBO STC 059

Sue ware pot fragment showing paddling marks. Quartz inclusions.
P18 & P69 in Oka.

AFC TBO STC 066

Fragment of the wall of a Sue ware pot (kame). Markings display paddle and anvil manufacturing technique.
P81 in Oka.
AF TBO STC 1081 and AF TBO STC 1082 combine to form this complex object.

AFC TBO STC 069＊

Sueki pottery fragment of Wall, with quartz . Maybe TK209 or TK217.
P77,78 in Oka.

AFC TBO STC 102＊

Sueki pottery fragment of a bottom with quartz inclusions
P100,P102 in Oka

AFC TBO STC 1057

Sueki pottery fragment of bottom with quartz inclusions and polished in the external surface.
P56, P55, P34, P73, P45, P36, P79, P75 in Oka.

AFC TBO STC 1105 ＊

Haji pottery fragment of Wall, small inckusions of quartz
P105＆P115 in Oka

AFC TBO STC 117 OM acquisition

Optical microscopy on surface and reflected light microscopy on pottery shard.

AFC TBO STC 117＊

Sue ware pottery fragment of wall, likely from a dish.
P28,71 in Oka. Found in excavation edition TBO1.

AFC TBO STC 117* OM processing and modeling

Characterization of pottery shard based on stereomicroscopy. The observations takes in consideration the outer part (front), inner part (back) and the cross section of the shard, characterizing the clay matrix, inclusions and other peculiarities.

AFTBO STC 030＊

Haji pottery, wall with inclusions of quartz and some traces of firing activity.
P5 in Oka.

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