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AF TBO STC 208 OM acquisition

Optical microscopy on surface and reflected light microscopy on pottery shard.

AF TBO STC 208 OM processing and modeling

Characterization of pottery shard based on stereomicroscopy. The observations takes in consideration the outer part (front), inner part (back) and the cross section of the shard, characterizing the clay matrix, inclusions and other peculiarities.

AF TBO STC 209

A fragment of the rim of the pedestal plate (Sue ware).

AF TBO STC 209 OM acquisition

Optical microscopy on surface and reflected light microscopy on pottery shard.

AF TBO STC 209 OM processing and modeling

Characterization of pottery shard based on stereomicroscopy. The observations takes in consideration the outer part (front), inner part (back) and the cross section of the shard, characterizing the clay matrix, inclusions and other peculiarities.

AF TBO STC 54 PG acquisition

AF TBO STC 59 PG acquisition

AF TBO sur 1001＊

古墳時代の須恵器甕片。
岡山大学遺物番号P1。

AF TBO sur 1002＊

古墳時代須恵器甕片。
岡山大学遺物番号P2。

AF TBO sur 1003＊

古墳時代の土師器片。
岡山大学遺物番号P3。

AF TBO TBO 115

Sueki pottery fragment of a lid or rim with big fragments of quartz inclusions

AF Test 220601

AF TGY 004

Earthenware cylindrical haniwa from Tenguyama Kofun in Okayama Prefecture

AF TGY 004 PG acquisition

AF TTK 001

Yayoi pottery - shard of Tokusyu-Kidai (large ceremonial pot stands) from Tatetski archaeological site

AF TTK 001 ICP-OES acquisition

Procedures for measurements and raw data.

AF TTK 001 ICP-OES Data interpretation_1

Classification of clay body according to Ca and Mg concentration.

AF TTK 001 ICP-OES processing and modeling

Quantitative elemental composition for major, minor and trace elements.

AF TTK 001 OM acquisition

Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF TTK 001

AF TTK 001 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF TTK 001 OM processing and modeling

Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).

AF TTK 001 PLM acquisition

Photomicrographs acquired at different magnifications.

AF TTK 001 PLM Data interpretation

Micromorphology of thin section from AF TTK 001.

AF TTK 001 PLM processing and modeling

Petrographic examination.

AF TTK 001 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF TTK 001 SEM EDX processing and modeling

Elemental examination of AF TTK 001 cross section.

AF TTK 001 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification. Images from 1 to 4 at 50 x.

AF TTK 001 XRF acquisition

Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy

AF TTK 001 XRF processing and modeling

Elemental analysis of AF TTK 001.

AF TTK 001 XRPD acquisition

X-ray Powder Diffraction from sample AF TTK 001.

AF TTK 001 XRPD processing and modeling

AF TTK 002

Yayoi pottery - shard of Tokusyu-Kidai (large ceremonial pot stands) from Tatetski archaeological site.

AF TTK 002 ICP-OES acquisition

Procedures for measurements and raw data.

AF TTK 002 ICP-OES Data interpretation_1

Classification of clay body according to Ca and Mg concentration

AF TTK 002 ICP-OES processing and modeling

Quantitative elemental composition for major, minor and trace elements.

AF TTK 002 OM acquisition

Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic samples AF TTK 002.

AF TTK 002 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF TTK 002 OM processing and modeling

Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).

AF TTK 002 PLM acquisition

Photomicrographs acquired at different magnifications.

AF TTK 002 PLM Data interpretation

Micromorphology of thin section from AF TTK 002.

AF TTK 002 PLM processing and modeling

Petrographic examination.

AF TTK 002 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF TTK 002 SEM EDX processing and modeling

Elemental examination of AF TTK 002 cross section.

AF TTK 002 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification. Images from 1 to 5 at 50 x.

AF TTK 002 XRF acquisition

Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy

AF TTK 002 XRF processing and modeling

Elemental analysis of AF TTK 002.

AF TTK 002 XRPD acquisition

X-ray Powder Diffraction from sample AF TTK 001.

AF TTK 002 XRPD processing and modeling

Mineralogical analysis.

AF TTK 003

Yayoi pottery - shard of Tokusyu-Kidai (large ceremonial pot stands) from Tatetski archaeological site

AF TTK 003 ICP-OES acquisition

Procedures for measurements and raw data.

AF TTK 003 ICP-OES Data interpretation_1

Classification of clay body according to Ca and Mg concentration.

AF TTK 003 ICP-OES processing and modeling

Quantitative elemental composition for major, minor and trace elements.

AF TTK 003 OM acquisition

Optical microscopy (stereomicroscopy= on surface and reflected light microscopy on polished cross sections of ceramic sample AF TTK 003.

AF TTK 003 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF TTK 003 OM processing and modeling

Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).

AF TTK 003 PLM acquisition

Photomicrographs acquired at different magnifications

AF TTK 003 PLM Data interpretation

Micromorphology of thin section from AF TTK 003.

AF TTK 003 PLM processing and modeling

Petrographic examination.

AF TTK 003 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF TTK 003 SEM EDX processing and modeling

Elemental examination of AF TTK 003 cross section.

AF TTK 003 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images 1 to 6 at 50 x. Images from 7 to 16 at 200x.

AF TTK 003 XRF acquisition

Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy

AF TTK 003 XRF processing and modeling

Elemental analysis of AF TTK 003.

AF TTK 003 XRPD acquisition

X-ray Powder Diffraction from shard AF TTK 003.

AF TTK 003 XRPD processing and modeling

Mineralogical analysis.

AF TTK 004

Yayoi pottery - shard of Tokusyu-Kidai(large ceremonial pot stands) from Tatetski archaeological site.

AF TTK 004 ICP-OES acquisition

Procedures for measurements and raw data.

AF TTK 004 ICP-OES Data interpretation_1

Classification of clay body according to Ca and Mg concentration.

AF TTK 004 ICP-OES processing and modeling

Quantitative elemental composition for major, minor and trace elements.

AF TTK 004 OM acquisition

Optical microscopy (stereomicroscopy= on surface and reflected light microscopy on polished cross sections of ceramic sample AF TTK 004.

AF TTK 004 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF TTK 004 OM processing and modeling

Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).

AF TTK 004 PLM acquisition

Photomicrographs acquired at different magnifications.

AF TTK 004 PLM Data interpretation

Micromorphology of thin section from AF TTK 004.

AF TTK 004 PLM processing and modeling

Petrographic examination.

AF TTK 004 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF TTK 004 SEM EDX processing and modeling

Elemental examination of AF TTK 004 cross section.

AF TTK 004 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x, 100x and 200x magnification.

AF TTK 004 XRF acquisition

Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy

AF TTK 004 XRF processing and modeling

Elemental analysis of AF TTK 004.

AF TTK 004 XRPD acquisition

AF TTK 004 XRPD processing and modeling

Mineralogical analysis.

AF TTK 005

Yayoi pottery - shard of Tokusyu-Kidai (large ceremonial pot stands) from Tatetski archaeological site.

AF TTK 005 ICP-OES acquisition

Procedures for measurements and raw data.

AF TTK 005 ICP-OES Data interpretation_1

Classification of clay body according to Ca and Mg concentration.

AF TTK 005 ICP-OES processing and modeling

Quantitative elemental composition for major, minor and trace elements.

AF TTK 005 OM acquisition

Optical microscopy (stereomicroscopy= on surface and reflected light microscopy on polished cross sections of ceramic sample AF TTK 005.

AF TTK 005 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF TTK 005 OM processing and modeling

Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).