アイテム
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SU 04 Block A
第4トレンチ ブロックA -
AF 134 XRF acquisition
XRF investigation of AF 134 surface -
XRF acquisition of AF 133
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micro-XRD acquisition of AF 130
micro-X Ray Diffraction analysis of two points on the surface of AF 130 -
micro-XRD acquisition of AF 155
micro-X Ray Diffraction analysis of a point on the surface of AF 155 -
AF 156 XRF acquisition
XRF investigation of AF 156 surface -
AF 155 XRF acquisition
XRF investigation of AF 155 surface -
AF 129 XRF processing
Elemental analysis of AF 129 surface -
AF 156 Computer Tomography
3D recontstruction and axial, coronal and sagittal view of slices of AF 156 -
AF 155 Computer Tomography
3D recontstruction and axial, coronal and sagittal view of slices of AF 155 -
OM acquisition of AF 138
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AF 138 Computer Tomography
3D reconstruction and axial, coronal and sagittal view of slices of AF 138 -
OM acquisition of AF 135
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AF 135 Computer Tomography
3D recontstruction and axial, coronal and sagittal view of slices of AF 135 -
OM acquisition of AF 134
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AF 134 Computer Tomography
3D recontstruction and axial, coronal and sagittal view of slices of AF 134 -
AF 137 Computer Tomography
3D recontstruction and axial, coronal and sagittal view of slices of AF 137 -
OM acquisition of AF 133
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AF 133 Computer Tomography
3D recontstruction and axial, coronal and sagittal view of slices of AF 133 -
AF 137 XRF processing
Elemental composition of the surface of AF 137 -
AF 135 XRF processing
Elemental composition of the surface of AF 135 -
AF 135 XRF acquisition
XRF spectrum of AF 135 surface -
AF 136 Computer Tomography
3D recontstruction and axial, coronal and sagittal view of slices of AF 136 -
OM acquisition of AF 136
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AF 136 XRF processing
Elemental composition of the surface of AF 136