アイテム

• AF UEN 002 PLM Data interpretation
  Micromorphology of thin section from AF UEN 002
• AF UEN 002 PLM processing and modeling
  Petrographic examination.
• AF UEN 002 PLM acquisition
  Photomicrographs acquired at different magnifications
• AF ZMT 003 OM process and modeling
  Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).
• AF UEN 002 OM processing and modeling
  Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).
• AF UEN 001 PLM Data interpretation
  Micromorphology of thin section from AF UEN 001.
• PRELIMINARY INDICATIONS - THIN SECTION ANALYSIS
  Preliminary indications on ceramic thin section petrographic analysis.
• Guidelines for Petrographic examination in thin section
  Guidelines for Ceramic Petrographic examination in thin section
• AFC TBO STC 1057
  Sueki pottery fragment of bottom with quartz inclusions and polished in the external surface. P56, P55, P34, P73, P45, P36, P79, P75 in Oka.
• AF TBO STC 057 ＊
  Sueki pottery fragment of bottom with quartz inclusions and polished in the external surface. P73 in Oka.
• AF TBO STC 1028＊
  古墳時代(TK217型式)の須恵器杯蓋片。 岡山大学遺物番号P28。 AF TBO STC 012と接合。
• AF TBO STC 1082
  Sue ware fragment of pottery wall (kame) displaying marks deriving from paddle and anvil manufacturing technique. P81 in Oka. Combines with AF TBO STC 1081 to form AFC TBO STC 066. 古墳時代の須恵器片。 岡山大学遺物番号P81。 AF TBO STC 1081と接合（AFC TBO STC 066）。
• AF TBO STC 1081
  Sue ware fragment of pottery wall (kame) displaying marks deriving from paddle and anvil manufacturing technique. P81 in Oka. Combines with AF TBO STC 1082 to form AFC TBO STC 066. 古墳時代の須恵器片。 岡山大学遺物番号P81。 AF TBO STC 1082と接合。（AFC TBO STC 066）
• AF TBO STC 1069 ＊
  Fragment of pottery wall, maybe Sueki, with quartz inclusions. Maybe a jar. P69 in Oka.
• AF UEN 001 OM processing and modeling
  Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).
• AF ZMT 006 OM acquisition
  Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF ZMT 006.
• AF ZMT 004 OM acquisition
  Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF ZMT 004.
• AF ZMT 003 OM acquisition
  Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF ZMT 003.
• AF UEN 002 OM acquisition
  Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF UEN 002.
• AF TBO STC 1078＊
  古墳時代須恵器口縁部片。 岡山大学遺物番号P78
• AF TBO STC 1077＊
  古墳時代須恵器口縁部片。 岡山大学遺物番号P77
• AF TBO STC 1102＊
  古墳時代須恵器片。 岡山大学遺物番号P102。
• AF TBO STC 1100＊
  古墳時代須恵器片。 岡山大学遺物番号P100。
• AFC TBO STC 1013＊
  古墳時代土師器口縁部・底部片。 岡山大学遺物番号P13
• AFC TBO STC 1105 ＊
  Haji pottery fragment of Wall, small inckusions of quartz P105＆P115 in Oka