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AF TTK 001 PLM processing and modeling Petrographic examination.
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AF TTK 001 PLM acquisition Photomicrographs acquired at different magnifications.
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AF TTK 001 OM processing and modeling
Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).
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AF TTK 001 OM acquisition Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF TTK 001
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AF ISH 007 PLM Data interpretation
Micromorphology of thin section from AF ISH 007.
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AF ISH 007 PLM processing and modelling
Petrographic examination.
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AF ISH 007 PLM acquisition Photomicrographs acquired at different magnifications.
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AF ISH 007 OM processing and modelling
Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).
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AF ISH 007 OM acquisition Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic samples AF ISH 007.
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AF ZMT 006 PLM Data interpretation
Micromorphology of thin section from AF ZMT 006
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AF ZMT 006 PLM processing and modelling Petrographic examination.
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AF ZMT 006 PLM acquisition Photomicrographs acquired at different magnifications.
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AF ZMT 006 OM processing and modelling
Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).
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AF ZMT 005 PLM Data interpretation
Micromorphology of thin section from AF ZMT 005.
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AF ZMT 005 PLM processing and modelling Petrographic examination.
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AF ZMT 005 PLM acquisition Photomicrographs acquired at different magnifications.
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AF ZMT 005 OM processing and modelling
Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).
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AF ZMT 005 OM acquisition Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF ZMT 005.
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AF ZMT 004 PLM Data interpretation
Micromorphology of thin section from AF ZMT 004.
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AF ZMT 004 PLM processing and modeling Petrographic examination
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AF ZMT 004 PLM acquisition Photomicrographs acquired at different magnifications
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AF ZMT 004 OM processing and modeling
Incisions description (parallel, curved and even impressions).
Inclusions characterization (color, shape and size).
Cross section characterization (in case of visible layers).
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AF ZMT 003 PLM Data interpretation
Micromorphology of thin section from AF ZMT 003.
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AF ZMT 003 PLM processing and modeling
Petrographic examination.
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AF ZMT 003 PLM acquisition Photomicrographs acquired at different magnifications
