アイテム
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SEM EDX - TT and SH Bodies 200x Varience SEM EDX varience based on the bodies values of samples from Tatetsuki and Shimne at 200x magnification. -
SEM EDX - TT and SH Bodies 200x Scores SEM EDX scores based on the bodies values of samples from Tatetsuki and Shimne at 200x magnification. -
SEM EDX - TT and SH Bodies 200x Modelling power SEM EDX modelling power based on the bodies values of samples from Tatetsuki and Shimne at 200x magnification. -
SEM EDX - TT and SH Bodies 200x Loadings SEM EDX values from the bodies of samples from Tatetsuki and Shimne at 200x magnification. -
AF TTK 010 PLM Data interpretation Micromorphology of thin section from AF TTK 010
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AF TTK 010 PLM processing and modeling Petrographic examination. -
AF TTK 010 PLM acquisition Photomicrographs acquired at different magnifications. -
AF TTK 009 PLM Data interpretation Micromorphology of thin section from AF TTK 009.
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AF TTK 009 PLM processing and modeling Petrographic examination. -
AF TTK 009 PLM acquisition Photomicrographs acquired at different magnifications. -
TT8 PLM Data interpretation Micromorphology of thin section from TT8
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TT8 PLM processing and modelling Petrographic examination -
TT8 PLM acquisition Photomicrographs acquired at different magnifications -
AF TTK 007 PLM Data interpretation Micromorphology of thin section from AF TTK 007
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AF TTK 007 PLM processing and modeling Petrographic examination -
AF TTK 007 PLM acquisition Photomicrographs acquired at different magnifications -
AF TTK 006 PLM Data interpretation Micromorphology of thin section from ceramic shard.
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AF TTK 006 PLM processing and modeling Petrographic examination -
AF TTK 006 PLM acquisition Photomicrographs acquired at different magnifications -
AF TTK 005 PLM Data interpretation Micromorphology of thin section from AF TTK 005.
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AF TTK 005 PLM processing and modeling Petrographic examination. -
AF TTK 005 PLM acquisition Photomicrographs acquired at different magnifications. -
AF TTK 004 PLM Data interpretation Micromorphology of thin section from AF TTK 004.
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AF TTK 004 PLM processing and modeling Petrographic examination. -
AF TTK 004 PLM acquisition Photomicrographs acquired at different magnifications.