アイテム

• AF TTK 001 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF ISH 007 SEM EDX processing and modelling
  Elemental examination of AF ISH 007 cross section.
• AF ISH 007 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF ZMT 006 SEM EDX processing and modelling
  Elemental examination of AF ZMT 006 cross section.
• AF ZMT 006 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF ZMT 005 SEM EDX processing and modelling
  Elemental examination of AF ZMT 005 cross section.
• AF ZMT 005 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF ZMT 004 SEM EDX processing and modeling
  Elemental examination of AF ZMT 004 cross section.
• AF ZMT 004 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF ZMT 003 SEM EDX processing and modeling
  Elemental examination of AF ZMT 003 cross section.
• AF ZMT 003 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF UEN 002 SEM EDX processing and modeling
  Elemental examination of AF UEN 002 cross section.
• AF UEN 002 SEM EDX acquisition
  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
• AF TTK 010 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification.
• AF TTK 009 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification.
• AF TTK 008 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x.
• AF TTK 007 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification.
• AF TTK 006 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification.
• AF TTK 005 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification.
• AF TTK 004 OM for SEM acquisition
  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
• AF TTK 004 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x, 100x and 200x magnification.
• AF TTK 003 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images 1 to 6 at 50 x. Images from 7 to 16 at 200x.
• AF TTK 002 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification. Images from 1 to 5 at 50 x.
• AF TTK 001 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification. Images from 1 to 4 at 50 x.
• AF ISH 007 SEM images acquisition
  Backscattered Images acquired by Scanning Electron Microscopy at 50x and 100x magnification. Images from right to left top and bottom surface 1 to 5 at 50 x. Image 6 at 100x.