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AF ZMT 005 PLM acquisition

Photomicrographs acquired at different magnifications.

AF ZMT 005 PLM Data interpretation

Micromorphology of thin section from AF ZMT 005.

AF ZMT 005 PLM processing and modelling

Petrographic examination.

AF ZMT 005 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF ZMT 005 SEM EDX processing and modelling

Elemental examination of AF ZMT 005 cross section.

AF ZMT 005 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images from right to left top and bottom surface 1 to 4 at 50 x. Images from 5 to 13 at 200x.

AF ZMT 005 XRF acquisition

Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy

AF ZMT 005 XRF processing and modelling

Elemental analysis of AF ZMT 005.

AF ZMT 005 XRPD acquisition

X-ray Powder Diffraction analysis on sample AF ZMT 005.

AF ZMT 005 XRPD processing and modelling

Mineralogical analysis.

AF ZMT 006

Yayoi pottery - Kidai (vessel stand) from Zanmochi 6 (Shimane) archaeological site.

AF ZMT 006 ICP-OES Acquisition

Procedures for measurements and raw data.

AF ZMT 006 ICP-OES Data interpretation_1

Classification of clay body according to Ca and Mg concentration.

AF ZMT 006 ICP-OES processing and modelling

Quantitative elemental composition for major, minor and trace elements.

AF ZMT 006 OM acquisition

Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF ZMT 006.

AF ZMT 006 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF ZMT 006 OM processing and modelling

Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

AF ZMT 006 PLM acquisition

Photomicrographs acquired at different magnifications.

AF ZMT 006 PLM Data interpretation

Micromorphology of thin section from AF ZMT 006

AF ZMT 006 PLM processing and modelling

Petrographic examination.

AF ZMT 006 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF ZMT 006 SEM EDX processing and modelling

Elemental examination of AF ZMT 006 cross section.

AF ZMT 006 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images from right to left top and bottom surface 1 to 7 at 50 x. Images from 8 to 20 at 200x.

AF ZMT 006 XRF acquisition

Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy

AF ZMT 006 XRF processing and modelling

Elemental analysis of AF ZMT 006.

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