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AF UEN 002 PLM processing and modeling

Petrographic examination.

AF UEN 002 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF UEN 002 SEM EDX processing and modeling

Elemental examination of AF UEN 002 cross section.

AF UEN 002 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images along the surface from left to right: 1 to 5 at 50x Images from 6 to 12 at 200x

AF UEN 002 XRPD acquisition

X-ray Powder Diffraction analysis on sample AF UEN 002.

AF UEN 002 XRPD processing and modeling

Mineralogical analysis.

AF UEN 016

AF UEN 016 PG acquisition

AF UEN 022

AF UEN 022 PG acquisition

AF ZMT 003

Yayoi pottery - Tokusyu-Tsubo (large ceremonial vessel/jar) from Zanmochi 3 (Shimane) archaeological site.

AF ZMT 003 ICP-OES acquisition

Procedures for measurements and raw data.

AF ZMT 003 ICP-OES Data interpretation_1

Classification of clay body according to Ca and Mg concentration.

AF ZMT 003 ICP-OES processing and modeling

Quantitative elemental composition for major, minor and trace elements.

AF ZMT 003 OM acquisition

Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF ZMT 003.

AF ZMT 003 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF ZMT 003 OM process and modeling

Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).