2073 items

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  AF UEN 001 OM acquisition

  Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF UEN 001.
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  AF UEN 001 OM for SEM acquisition

  Optical microphotogrametry specifying areas for areas analysed by Scanning Electron Microscopy with Energy Dispersive X-ray.
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  AF UEN 001 OM interpretation_1

  Micromorphology of the surface of ceramic shard.
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  AF UEN 001 OM interpretation_2

  Micromorphology of AF UEN 001 cross-section compared with those of fragments with similar elemental composition determined by ICP-OES.
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  AF UEN 001 OM processing and modeling

  Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).
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  AF UEN 001 PLM acquisition

  Photomicrographs acquired at different magnifications.
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  AF UEN 001 PLM Data interpretation

  Micromorphology of thin section from AF UEN 001.
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  AF UEN 001 PLM processing and modeling

  Petrographic examination
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  AF UEN 001 SEM Accuracy Value table

  AF UEN 001 SEM Accuracy Value table
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  AF UEN 001 SEM EDX acquisition

  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
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  AF UEN 001 SEM EDX processing and modeling

  Elemental examination of AF UEN 001 cross section.
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  AF UEN 001 SEM images acquisition

  Backscattered Images acquired by Scanning Electron Microscopy at 50x and 200x magnification. Images along the surface from left to right from 1 to 6 at 50x; 7 to 16 at 200x; Images also under 17 to 19 at 50x
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  AF UEN 001 XRF acquisition

  Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy
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  AF UEN 001 XRF processing and modeling

  Elemental analysis of AF UEN 001.
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  AF UEN 001 XRPD acquisition

  X-ray Powder Diffraction analysis on sample AF UEN 001.
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  AF UEN 001 XRPD processing and modeling

  Mineralogical analysis.
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  AF UEN 002

  Yayoi pottery - Tokusyu-Tsubo(large ceremonial vessel/jar) from Ueno 2 (Shimane) archaeological site.
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  AF UEN 002 ICP-OES acquisition

  Procedures for measurements and raw data.
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  AF UEN 002 ICP-OES Data Interpretation_1

  Classification of clay body according to Ca and Mg concentration
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  AF UEN 002 ICP-OES processing and modeling

  Quantitative elemental composition for major, minor and trace elements.
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  AF UEN 002 OM acquisition

  Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF UEN 002.
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  AF UEN 002 OM for SEM acquisition

  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopy with Energy Dispersive X-ray.
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  AF UEN 002 OM processing and modeling

  Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).
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  AF UEN 002 PLM acquisition

  Photomicrographs acquired at different magnifications
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  AF UEN 002 PLM Data interpretation

  Micromorphology of thin section from AF UEN 002