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2073 items
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2073 items

  • AF TTK 110 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

  • AF TTK 110 XRF processing and modelling

    XRF quantitative analysis processed by Olympus Vanta software. "Name" is referred to the shard code with a progressive number indicating different measurements spots. "Note" shows the location of measurement spots. The values of the elements are expressed as a percentage by weight. "LE" means light elements i.e. the amount of elements not detectable (Tatetsuki pottery Vanta chemistry XRF results.xlsx). XRF quantitative analysis processed by Olympus Vanta software converted into oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, K2O and TiO2. The conversion to oxides is obtained by multiplying the weight concentration of the element by a conversion factor derived from the ratio of molecular weight of the chosen oxide divided by the atomic weight of the elements. (Tatetsuki pottery Vanta chemistry XRF oxides results.xlsx).

  • AF TTK 111 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

  • AF TTK 111 XRF processing and modelling

    XRF quantitative analysis processed by Olympus Vanta software. "Name" is referred to the shard code with a progressive number indicating different measurements spots. "Note" shows the location of measurement spots. The values of the elements are expressed as a percentage by weight. "LE" means light elements i.e. the amount of elements not detectable (Tatetsuki pottery Vanta chemistry XRF results.xlsx). XRF quantitative analysis processed by Olympus Vanta software converted into oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, K2O and TiO2. The conversion to oxides is obtained by multiplying the weight concentration of the element by a conversion factor derived from the ratio of molecular weight of the chosen oxide divided by the atomic weight of the elements. (Tatetsuki pottery Vanta chemistry XRF oxides results.xlsx).

  • AF TTK 112 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

  • AF TTK 112 XRF processing and modelling

    XRF quantitative analysis processed by Olympus Vanta software. "Name" is referred to the shard code with a progressive number indicating different measurements spots. "Note" shows the location of measurement spots. The values of the elements are expressed as a percentage by weight. "LE" means light elements i.e. the amount of elements not detectable (Tatetsuki pottery Vanta chemistry XRF results.xlsx). XRF quantitative analysis processed by Olympus Vanta software converted into oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, K2O and TiO2. The conversion to oxides is obtained by multiplying the weight concentration of the element by a conversion factor derived from the ratio of molecular weight of the chosen oxide divided by the atomic weight of the elements. (Tatetsuki pottery Vanta chemistry XRF oxides results.xlsx).

  • AF TTK 113 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

  • AF TTK 113 XRF processing and modelling

    XRF quantitative analysis processed by Olympus Vanta software. "Name" is referred to the shard code with a progressive number indicating different measurements spots. "Note" shows the location of measurement spots. The values of the elements are expressed as a percentage by weight. "LE" means light elements i.e. the amount of elements not detectable (Tatetsuki pottery Vanta chemistry XRF results.xlsx). XRF quantitative analysis processed by Olympus Vanta software converted into oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, K2O and TiO2. The conversion to oxides is obtained by multiplying the weight concentration of the element by a conversion factor derived from the ratio of molecular weight of the chosen oxide divided by the atomic weight of the elements. (Tatetsuki pottery Vanta chemistry XRF oxides results.xlsx).

  • AF TTK 114 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

  • AF TTK 114 XRF processing and modelling

    XRF quantitative analysis processed by Olympus Vanta software. "Name" is referred to the shard code with a progressive number indicating different measurements spots. "Note" shows the location of measurement spots. The values of the elements are expressed as a percentage by weight. "LE" means light elements i.e. the amount of elements not detectable (Tatetsuki pottery Vanta chemistry XRF results.xlsx). XRF quantitative analysis processed by Olympus Vanta software converted into oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, K2O and TiO2. The conversion to oxides is obtained by multiplying the weight concentration of the element by a conversion factor derived from the ratio of molecular weight of the chosen oxide divided by the atomic weight of the elements. (Tatetsuki pottery Vanta chemistry XRF oxides results.xlsx).

  • AF TTK 115 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

  • AF TTK 115 XRF processing and modelling

    XRF quantitative analysis processed by Olympus Vanta software. "Name" is referred to the shard code with a progressive number indicating different measurements spots. "Note" shows the location of measurement spots. The values of the elements are expressed as a percentage by weight. "LE" means light elements i.e. the amount of elements not detectable (Tatetsuki pottery Vanta chemistry XRF results.xlsx). XRF quantitative analysis processed by Olympus Vanta software converted into oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, K2O and TiO2. The conversion to oxides is obtained by multiplying the weight concentration of the element by a conversion factor derived from the ratio of molecular weight of the chosen oxide divided by the atomic weight of the elements. (Tatetsuki pottery Vanta chemistry XRF oxides results.xlsx).

  • AF TTK 116 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

  • AF TTK 116 XRF processing and modelling

    XRF quantitative analysis processed by Olympus Vanta software. "Name" is referred to the shard code with a progressive number indicating different measurements spots. "Note" shows the location of measurement spots. The values of the elements are expressed as a percentage by weight. "LE" means light elements i.e. the amount of elements not detectable (Tatetsuki pottery Vanta chemistry XRF results.xlsx). XRF quantitative analysis processed by Olympus Vanta software converted into oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, K2O and TiO2. The conversion to oxides is obtained by multiplying the weight concentration of the element by a conversion factor derived from the ratio of molecular weight of the chosen oxide divided by the atomic weight of the elements. (Tatetsuki pottery Vanta chemistry XRF oxides results.xlsx).

  • AF TTK 117 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

  • AF TTK 117 XRF processing and modelling

    XRF quantitative analysis processed by Olympus Vanta software. "Name" is referred to the shard code with a progressive number indicating different measurements spots. "Note" shows the location of measurement spots. The values of the elements are expressed as a percentage by weight. "LE" means light elements i.e. the amount of elements not detectable (Tatetsuki pottery Vanta chemistry XRF results.xlsx). XRF quantitative analysis processed by Olympus Vanta software converted into oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, K2O and TiO2. The conversion to oxides is obtained by multiplying the weight concentration of the element by a conversion factor derived from the ratio of molecular weight of the chosen oxide divided by the atomic weight of the elements. (Tatetsuki pottery Vanta chemistry XRF oxides results.xlsx).

  • AF TTK 118 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

  • AF TTK 118 XRF processing and modelling

    XRF quantitative analysis processed by Olympus Vanta software. "Name" is referred to the shard code with a progressive number indicating different measurements spots. "Note" shows the location of measurement spots. The values of the elements are expressed as a percentage by weight. "LE" means light elements i.e. the amount of elements not detectable (Tatetsuki pottery Vanta chemistry XRF results.xlsx). XRF quantitative analysis processed by Olympus Vanta software converted into oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, K2O and TiO2. The conversion to oxides is obtained by multiplying the weight concentration of the element by a conversion factor derived from the ratio of molecular weight of the chosen oxide divided by the atomic weight of the elements. (Tatetsuki pottery Vanta chemistry XRF oxides results.xlsx).

  • AF TTK 119 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

  • AF TTK 119 XRF processing and modelling

    XRF quantitative analysis processed by Olympus Vanta software. "Name" is referred to the shard code with a progressive number indicating different measurements spots. "Note" shows the location of measurement spots. The values of the elements are expressed as a percentage by weight. "LE" means light elements i.e. the amount of elements not detectable (Tatetsuki pottery Vanta chemistry XRF results.xlsx). XRF quantitative analysis processed by Olympus Vanta software converted into oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, K2O and TiO2. The conversion to oxides is obtained by multiplying the weight concentration of the element by a conversion factor derived from the ratio of molecular weight of the chosen oxide divided by the atomic weight of the elements. (Tatetsuki pottery Vanta chemistry XRF oxides results.xlsx).

  • AF TTK 120 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

  • AF TTK 120 XRF processing and modelling

    XRF quantitative analysis processed by Olympus Vanta software. "Name" is referred to the shard code with a progressive number indicating different measurements spots. "Note" shows the location of measurement spots. The values of the elements are expressed as a percentage by weight. "LE" means light elements i.e. the amount of elements not detectable (Tatetsuki pottery Vanta chemistry XRF results.xlsx). XRF quantitative analysis processed by Olympus Vanta software converted into oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, K2O and TiO2. The conversion to oxides is obtained by multiplying the weight concentration of the element by a conversion factor derived from the ratio of molecular weight of the chosen oxide divided by the atomic weight of the elements. (Tatetsuki pottery Vanta chemistry XRF oxides results.xlsx).

  • AF TTK 121 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

  • AF TTK 121 XRF processing and modelling

    XRF quantitative analysis processed by Olympus Vanta software. "Name" is referred to the shard code with a progressive number indicating different measurements spots. "Note" shows the location of measurement spots. The values of the elements are expressed as a percentage by weight. "LE" means light elements i.e. the amount of elements not detectable (Tatetsuki pottery Vanta chemistry XRF results.xlsx). XRF quantitative analysis processed by Olympus Vanta software converted into oxides: SiO2, Al2O3, Fe2O3, CaO, MgO, K2O and TiO2. The conversion to oxides is obtained by multiplying the weight concentration of the element by a conversion factor derived from the ratio of molecular weight of the chosen oxide divided by the atomic weight of the elements. (Tatetsuki pottery Vanta chemistry XRF oxides results.xlsx).

  • AF TTK 122 OM processing and modeling

    Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).