2073 items

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  AF TTK 006 ICP-OES acquisition

  Procedures for measurements and raw data
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  AF TTK 006 ICP-OES Data interpretation_1

  Classification of clay body according to Ca and Mg concentration.
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  AF TTK 006 ICP-OES processing and modeling

  Quantitative elemental composition for major, minor and trace elements
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  AF TTK 006 OM acquisition

  Optical microscopy (stereomicroscopy= on surface and reflected light microscopy on polished cross sections of ceramic shard.
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  AF TTK 006 OM for SEM acquisition

  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
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  AF TTK 006 OM processing and modeling

  Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).
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  AF TTK 006 PLM acquisition

  Photomicrographs acquired at different magnifications
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  AF TTK 006 PLM Data interpretation

  Micromorphology of thin section from ceramic shard.
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  AF TTK 006 PLM processing and modeling

  Petrographic examination
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  AF TTK 006 SEM EDX acquisition

  Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.
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  AF TTK 006 SEM EDX processing and modeling

  Elemental examination of AF TTK 006 cross section.
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  AF TTK 006 SEM images acquisition

  Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification.
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  AF TTK 006 XRF acquisition

  Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy
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  AF TTK 006 XRF processing and modeling

  Elemental analysis of AF TTK 006.
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  AF TTK 006 XRPD acquisition
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  AF TTK 006 XRPD processing and modeling

  Mineralogical analysis
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  AF TTK 007

  Yayoi pottery - shard of Tokusyu-Kidai (large ceremonial pot stands) from Tatetski archaeological site.
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  AF TTK 007

  Decorated pottery stand from the Tatetsuki burial mound in Okayama Prefecture.
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  AF TTK 007 ICP-OES acquisition

  Procedures for measurements and raw data.
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  AF TTK 007 ICP-OES Data interpretation_1

  Classification of clay body according to Ca and Mg concentration.
• 

  AF TTK 007 ICP-OES processing and modeling

  Quantitative elemental composition for major, minor and trace elements.
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  AF TTK 007 OM acquisition

  Optical microscopy (stereomicroscopy= on surface and reflected light microscopy on polished cross sections of ceramic sample AF TTK 007.
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  AF TTK 007 OM for SEM acquisition

  Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.
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  AF TTK 007 OM processing and modeling

  Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).
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  AF TTK 007 PG acquisition