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AF TTK 004 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF TTK 004 SEM EDX processing and modeling

Elemental examination of AF TTK 004 cross section.

AF TTK 004 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x, 100x and 200x magnification.

AF TTK 004 XRF acquisition

Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy

AF TTK 004 XRF processing and modeling

Elemental analysis of AF TTK 004.

AF TTK 004 XRPD acquisition

AF TTK 004 XRPD processing and modeling

Mineralogical analysis.

AF TTK 005

Yayoi pottery - shard of Tokusyu-Kidai (large ceremonial pot stands) from Tatetski archaeological site.

AF TTK 005 ICP-OES acquisition

Procedures for measurements and raw data.

AF TTK 005 ICP-OES Data interpretation_1

Classification of clay body according to Ca and Mg concentration.

AF TTK 005 ICP-OES processing and modeling

Quantitative elemental composition for major, minor and trace elements.

AF TTK 005 OM acquisition

Optical microscopy (stereomicroscopy= on surface and reflected light microscopy on polished cross sections of ceramic sample AF TTK 005.

AF TTK 005 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF TTK 005 OM processing and modeling

Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

AF TTK 005 PLM acquisition

Photomicrographs acquired at different magnifications.

AF TTK 005 PLM Data interpretation

Micromorphology of thin section from AF TTK 005.

AF TTK 005 PLM processing and modeling

Petrographic examination.

AF TTK 005 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

AF TTK 005 SEM EDX processing and modeling

Elemental examination of AF TTK 005 cross section.

AF TTK 005 SEM images acquisition

Backscattered Images acquired by Scanning Electron Microscopy at 50x magnification.

AF TTK 005 XRF acquisition

Chemical analysis of pottery shard by X-Ray Fluorescence Spectroscopy

AF TTK 005 XRF processing and modeling

Elemental analysis of AF TTK 005.

AF TTK 005 XRPD acquisition

AF TTK 005 XRPD processing and modeling

Mineralogical analysis.

AF TTK 006

Yayoi pottery - shard of Tokusyu-Kidai (large ceremonial pot stands from Tatetski archaeological site.

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