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AF TBO STC 208 OM acquisition

Optical microscopy on surface and reflected light microscopy on pottery shard.

AF TBO STC 208 OM processing and modeling

Characterization of pottery shard based on stereomicroscopy. The observations takes in consideration the outer part (front), inner part (back) and the cross section of the shard, characterizing the clay matrix, inclusions and other peculiarities.

AF TBO STC 209

A fragment of the rim of the pedestal plate (Sue ware).

AF TBO STC 209 OM acquisition

Optical microscopy on surface and reflected light microscopy on pottery shard.

AF TBO STC 209 OM processing and modeling

Characterization of pottery shard based on stereomicroscopy. The observations takes in consideration the outer part (front), inner part (back) and the cross section of the shard, characterizing the clay matrix, inclusions and other peculiarities.

AF TBO STC 54 PG acquisition

AF TBO STC 59 PG acquisition

AF TBO sur 1001＊

古墳時代の須恵器甕片。岡山大学遺物番号P1。

AF TBO sur 1002＊

古墳時代須恵器甕片。岡山大学遺物番号P2。

AF TBO sur 1003＊

古墳時代の土師器片。岡山大学遺物番号P3。

AF TBO TBO 115

Sueki pottery fragment of a lid or rim with big fragments of quartz inclusions

AF Test 220601

AF TGY 004

Earthenware cylindrical haniwa from Tenguyama Kofun in Okayama Prefecture

AF TGY 004 PG acquisition

AF TTK 001

Yayoi pottery - shard of Tokusyu-Kidai (large ceremonial pot stands) from Tatetski archaeological site

AF TTK 001 ICP-OES acquisition

Procedures for measurements and raw data.

AF TTK 001 ICP-OES Data interpretation_1

Classification of clay body according to Ca and Mg concentration.

AF TTK 001 ICP-OES processing and modeling

Quantitative elemental composition for major, minor and trace elements.

AF TTK 001 OM acquisition

Optical microscopy (stereomicroscopy) on surface and reflected light microscopy on polished cross sections of ceramic sample AF TTK 001

AF TTK 001 OM for SEM acquisition

Optical microphotogrametry specifying areas for SEM images and areas analysed by Scanning Electron Microscopywith Energy Dispersive X-ray.

AF TTK 001 OM processing and modeling

Incisions description (parallel, curved and even impressions). Inclusions characterization (color, shape and size). Cross section characterization (in case of visible layers).

AF TTK 001 PLM acquisition

Photomicrographs acquired at different magnifications.

AF TTK 001 PLM Data interpretation

Micromorphology of thin section from AF TTK 001.

AF TTK 001 PLM processing and modeling

Petrographic examination.

AF TTK 001 SEM EDX acquisition

Elemental chemical composition acquired by Scanning Electron Microscopy with Energy Dispersive X-ray analysis.

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